PXRD - Bruker D2 Phaser X-Ray Diffractometer

Powder X-ray diffraction (PXRD) is a rapid analytical technique used for identification and characterisation of crystalline material. The Bruker D2 Phaser allows for the semi-quantitative, quantitative and qualitative analysis of crystalline materials.
PXRD is a non-destructive test, requiring only small amounts of the material for each test. A unique pattern called diffractogram is generated which acts as a ‘fingerprint’ during an analysis and is analysed using specialised Bruker software, such as Eva and Topaz, to identify and or quantify various phases within crystalline or semi crystalline materials.
Qualitative analysis of a diffractogram usually involves the identification of a phase or phases in a sample by comparison with “standard” patterns, and relative estimation of proportions of different phases in multiphase specimens by comparing peak intensities attributed to the identified phases. 
Quantitative analysis of diffractogram usually refers to the determination of amounts of different phases in multi-phase samples. Quantitative analysis may also be thought of in terms of the determination of particular characteristics of single phases including precise determination of crystal structure or crystallite size and shape. 



Qualitative analysis using EVA software of lead oxide which identified alpha PbO in the sample 


Semi-Quantitative analysis using Topaz software of lead oxide identifying the amount of lead and lead oxide present in the sample